Automotive Electronics

Posts tagged with diagnostics

SAVE THE DATE – ELIV Congress 2019

Visit Softing at the ELIV Congress 2019!

Meet us at the international congress for automotive electronics ELIV on October 16-17, 2019 in Bonn, Germany. In the fast-paced automotive market, it is of greater importance than ever before for OEMs and suppliers to have transparency when it comes to quality and reliability in all their often globally distributed process sequences. At ELIV (electronics in vehicles) congress in Bonn, Germany we will show you the support we can provide with our innovative and flexible diagnostic and test solutions.

ECU Quicktest – Identfying and testing errors with documentation with Softing DTS.monaco

Softing DTS.monaco: Identifing and testing errors with documentation

The identification of a test unit as well as the reading out of the error memory are activities which are repeated throughout the product life cycle. Regardless of whether HiL, test bench or vehicle – the versions as well as any error memory entries which might occur must be acquired and documented in every test sequence.

SAVE THE DATE – COMVEC™ 2019

Visit Softing at COMVEC 2019!

Meet Softing Automotive at COMVEC™ on September 9-11, 2019 in Indianapolis, IN, USA. The COMVEC™ Technology Connection is the convening point for the community that develops vehicles and equipment spanning the on-highway, off-highway (agriculture, construction, industrial), ground defense, and mining sectors.

Testing and Debugging the establishing of tester ECU communication with Softing DTS.monaco

Softing DTS.monaco Use Case: Testing and Debugging the establishing of tester ECU communication

Regardless of the integration level of software and ECUs, com­munication problems along the OSI communication layers result in specific challenges for diagnostic experts. These problems are critical for the remaining life cycle of the vehicle because, for example, in manufacturing, this behavior can lead to delays in or an entire absence of vehicle programming.

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